6
Publications
333
Citations
6
H-Index
2003
Active since
Affiliations
QED Technologies (United States)(Current)
Jon Fleig is an author at QED Technologies (United States) specializing in interferometry, instrumentation, and engineering.
Top concepts
EngineeringInterferometryInstrumentationCalibrationOptical ComponentsGeophysicsRadiometryActive OpticsTime MetrologyOptical Systems
Publications per year
2003–2009
6
6
Stitching Interferometry: A Flexible Solution for Surface Metrology
Paul E. Murphy, Greg Forbes, Jon Fleig et al. · Optics and Photonics News · 2003 · 115 citations
Paul E. Murphy, Gary DeVries, Jon Fleig et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2009 · 18 citations
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