John Melcher

Cantilever dynamics in atomic force microscopy

Arvind Raman, John Melcher, Ryan C. Tung · Nano Today · 2008 · 195 citations

Engineering, Physics, Microscopy +5

Equivalent point-mass models of continuous atomic force microscope probes

John Melcher, Shuiqing Hu, Arvind Raman · Applied Physics Letters · 2007 · 131 citations

Afm Probes, Engineering, Microscopy +17

Origins of phase contrast in the atomic force microscope in liquids

John Melcher, Carolina Carrasco, Xin Xu et al. · Proceedings of the National Academy of Sciences · 2009 · 115 citations · Full text

Engineering, Microscopy, Microrheology +18

Compositional Contrast of Biological Materials in Liquids Using the Momentary Excitation of Higher Eigenmodes in Dynamic Atomic Force Microscopy

Xin Xu, John Melcher, Sudipta Basak et al. · Physical Review Letters · 2009 · 88 citations

Engineering, Microscopy, Biomedical Engineering +16

Calibration of higher eigenmode spring constants of atomic force microscope cantilevers

José R. Lozano, Daniel Kiracofe, John Melcher et al. · Nanotechnology · 2010 · 64 citations

Engineering, Microscopy, Mechanical Engineering +18