Shinji Ozaki

Discriminating Molecular Length of Chemically Adsorbed Molecules Using an Atomic Force Microscope Having a Tip Covered with Sensor Molecules (An Atomic Force Microscope Having Chemical Sensing Function)

Tohru Nakagawa, Kazufumi Ogawa, Toshimitsu Kurumizawa et al. · Japanese Journal of Applied Physics · 1993 · 82 citations · Full text

Engineering, Microscopy, Adsorbed Molecules +21

Fabrication of self-assembled monolayer patterns by selective electron beam irradiation and a chemical adsorption technique

Norihisa Mino, Shinji Ozaki, Kazufumi Ogawa et al. · Thin Solid Films · 1994 · 29 citations

Materials Science, Chemical Engineering, Engineering +10

Characterization of silicon compounds using the Auger parameter in X-ray Photoelectron Spectroscopy (XPS)

Shigemi Kohiki, Shinji Ozaki, Tomoko Hamada et al. · Applied Surface Science · 1987 · 27 citations

Materials Science, Ii-vi Semiconductor, X-ray Spectroscopy +12

Wavelength-Dispersive Total Reflection X-Ray Fluorescence with High-Brilliance Undulator Radiation at SPring-8

N. Awaji, Shinji Ozaki, Junichi Nishino et al. · Japanese Journal of Applied Physics · 2000 · 17 citations

Engineering, High-brilliance Undulator Radiation, Metallic Impurities +17

A 400MHz 32b embedded microprocessor core AM34-1 with 4.0GB/s cross-bar bus switch for SoC

M. Nakajima, Takashi Yamamoto, Shinji Ozaki et al. · 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) · 2003 · 15 citations

System On Chip, Electrical Engineering, Cross-bar Bus Switch +15