Concepedia

C.F. Yeh

CY

Statistics

Publications

1

Citations

12

H-Index

1

Active since

2005

Affiliations

United Microelectronics (United States)(Current)

C.F. Yeh is an author at United Microelectronics (United States) specializing in reliability degradation, electrical engineering, and metal-oxide-semiconductor field-effect transistors.

Publications per year

2005–2005

1

Publications

1

A new observation of the germanium outdiffusion effect on the hot carrier and nbti reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices

Steve S. Chung, Y.R. Liu, C.F. Yeh et al. · 2005 · 12 citations

Engineering, Electrical Engineering, Materials Science +17

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