J.R. Fox

Oxide Thin Films for Tunable Microwave Devices

X. X. Xi, Hong-Cheng Li, Weidong Si et al. · Journal of Electroceramics · 2000 · 123 citations

Engineering, Electrical Engineering, Materials Science +14

In situ Raman scattering studies of the amorphous and crystalline Si nanoparticles

A. A. Sirenko, J.R. Fox, X. X. Xi et al. · Solid State Communications · 2000 · 75 citations

Natural Sciences, Materials Science, Physics +14

Metal–oxide bilayer Raman scattering in SrTiO3 thin films

V. I. Merkulov, J.R. Fox, Hongcheng Li et al. · Applied Physics Letters · 1998 · 42 citations

Natural Sciences, Materials Science, Physics +16

Electronic and vibrational properties of laser modified C60

Gregory P. Lopinski, J.R. Fox, J. S. Lannin · Chemical Physics Letters · 1995 · 25 citations

Natural Sciences, Materials Science, Physics +12

Neutron diffraction and structural models of RbC60 phases

J.R. Fox, Gregory P. Lopinski, J. S. Lannin et al. · Chemical Physics Letters · 1996 · 22 citations · Full text

Natural Sciences, Materials Science, Physics +15