Aidan P. Conlan

Mechanisms of Liquid-Phase Exfoliation for the Production of Graphene

Zheling Li, Robert J. Young, Claudia Backes et al. · ACS Nano · 2020 · 302 citations · Full text

Improved measurement of electric fields by nanobeam precession electron diffraction

Lucas Bruas, Victor Boureau, Aidan P. Conlan et al. · Journal of Applied Physics · 2020 · 31 citations · Full text

Silicon P–n Junction, Engineering, Electron Microscopy +13

Thermal robustness of magnetic tunnel junctions with perpendicular shape anisotropy

Steven Lequeux, N. Perrissin, Gabin Grégoire et al. · Nanoscale · 2020 · 22 citations

Direct measurement of TEM lamella thickness in FIB‐SEM

Aidan P. Conlan, Evan Tillotson, Alexander Rakowski et al. · Journal of Microscopy · 2019 · 17 citations

Materials Science, Engineering, Electron Microscopy +14

Electron beam induced current microscopy of silicon <i>p–n</i> junctions in a scanning transmission electron microscope

Aidan P. Conlan, Grigore Moldovan, Lucas Bruas et al. · Journal of Applied Physics · 2021 · 13 citations

Electrical Engineering, Engineering, Electron Microscopy +14