A. D. Lantsov

Through-focus scanning optical microscopy (TSOM) considering optical aberrations: practical implementation

Maxim Ryabko, A. A. Shchekin, Sergey Koptyaev et al. · Optics Express · 2015 · 22 citations · Full text

Engineering, Materials Engineering, Materials Science +14

Method for optical inspection of nanoscale objects based upon analysis of their defocused images and features of its practical implementation

Maxim Ryabko, S. Koptyaev, A. D. Lantsov et al. · Optics Express · 2013 · 21 citations · Full text

Natural Sciences, Materials Science, Nanomaterials +15

Motion-free all optical inspection system for nanoscale topology control

Maxim Ryabko, Sergey Koptyaev, A. D. Lantsov et al. · Optics Express · 2014 · 20 citations · Full text

Engineering, Materials Engineering, Materials Science +14

Correlation method for processing speckles of signals from single-fibre multimode interferometers by using charge-coupled devices

Yurii N Kulchin, Oleg B. Vitrik, A. D. Lantsov · Quantum Electronics · 2006 · 16 citations

Engineering, Electrical Engineering, Optoelectronics +16