Concepedia
Statistics
Publications
8
Citations
298
H-Index
Active since
1995
Affiliations
Hitachi (Canada)(Current)
Hitachi (Japan)
Hitachi High-Tech (Japan)
National Institute for Nanotechnology
David Hoyle is an author at Hitachi (Canada) specializing in engineering, electron microscopy, and microanalysis.
Publications per year
1995–2013
Automated Four-Point Probe Measurement of Nanowires Inside a Scanning Electron Microscope
Changhai Ru, Yong Zhang, Yu Sun et al. · IEEE Transactions on Nanotechnology · 2010 · 115 citations
Engineering, Mechanical Engineering, Mechatronics Engineering +16
An H/sub infinity / approach to two degree of freedom design
David Hoyle, Richard Hyde, D.J.N. Limebeer · 2002 · 75 citations
Engineering, Mathematics, Systems Engineering +17
Contamination Cleaning of TEM/SEM Samples with the ZONE Cleaner
Charles Soong, Patrick Woo, David Hoyle · Microscopy Today · 2012 · 43 citations
Medicine, Microbiology, Analytical Chemistry +15
High Resolution From a New Laterolog With Azimuthal Imaging
J.W. Smits, D. Benimeli, I. Dubourg et al. · SPE Annual Technical Conference and Exhibition · 1995 · 16 citations
Engineering, Geological Engineering, Petroleum Engineering +13
UV Treatment of TEM/STEM Samples for Reduced Hydrocarbon Contamination
David Hoyle, Marek Malac, M. Trudeau et al. · Microscopy and Microanalysis · 2011 · 15 citations · Full text
Pharmacy, Chemical Engineering, Elemental Analysis +5
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