Statistics
Publications
1
Citations
10
H-Index
1
Active since
2005
Affiliations
Toshiba (Japan)(Current)
A. Nakayama is an author at Toshiba (Japan) specializing in at-speed testing, nonvolatile memory devices, and memory test.
Publications per year
2005–2005
1
1
Cantilever type probe card for at-speed memory test on wafer
Hiroshi Iwai, A. Nakayama, N. Itoga et al. · 2005 · 10 citations
Engineering, Computer Engineering, Electrical Engineering +14
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