M. Shahram

Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance in nanometer technologies

Xiaoning Qi, Alex Gyure, Yan-Sheng Luo et al. · 2006 · 31 citations

Engineering, Electrical Engineering, Electronic Materials +16

Analytical modeling of crosstalk noise waveforms using Weibull function

A. Kasnavi, J.W. Wang, M. Shahram et al. · 2005 · 19 citations

Engineering, Electrical Engineering, Analog Electronics +16

A New Simulation Method for NBTI Analysis in SPICE Environment

Rakesh Vattikonda, Yan-Sheng Luo, Alex Gyure et al. · 2007 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +17

Efficient subthreshold leakage current optimization - Leakage current optimization and layout migration for 90- and 65- nm ASIC libraries

Xiaoning Qi, Sam Lo, Alex Gyure et al. · IEEE Circuits and Devices Magazine · 2006 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +17