Concepedia

David Fong

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Publications

1

Citations

11

H-Index

1

Active since

2006

Affiliations

Veeco (United Kingdom)(Current)

David Fong is an author at Veeco (United Kingdom) specializing in scanning electron microscope metrology, nanometer-scale metrology, and sidewall testing.

Publications per year

2006–2006

1

Publications

1

Carbon nanotube AFM probes for microlithography process control

Bernard Haochih Liu, David Fong, Gregory A. Dahlen et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2006 · 11 citations

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