Mark W Lund

Temperature characterization of deep and shallow defect centers of low noise silicon JFETs

C. Arnaboldi, A. Fascilla, Mark W Lund et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2003 · 15 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Low-cost method for stabilization of a CO2 laser for use in far infrared laser pumping

Mark W Lund, J. N. Cogan, Jeffrey A. Davis · Review of Scientific Instruments · 1979 · 13 citations

Natural Sciences, Physics, Optics +12

Characterization of WCx/B4C multilayers sputtered in reactive argon/methane atmospheres

Patrick Diehl, Mark W Lund, David W. Madsen et al. · Thin Solid Films · 1994 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +6

Low noise JFETs for room temperature x-ray detectors

Mark W Lund, K. Decker, Raymond T. Perkins et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1996 · 11 citations

Engineering, Electrical Engineering, Microelectronics +13