S. Tachibana

Selective Backscattered Electron Imaging of Material and Channeling Contrast in Microstructures of Scale on Low Carbon Steel Controlled by Accelerating Voltage and Take-off Angle

Tomohiro Aoyama, Masayasu Nagoshi, Hideki Nagano et al. · ISIJ International · 2011 · 33 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +11

Bulk nature of layered perovskite iridates beyond the Mott scenario: An approach from a bulk-sensitive photoemission study

A. Yamasaki, S. Tachibana, H. Fujiwara et al. · Physical Review B · 2014 · 29 citations · Full text

Natural Sciences, Materials Science, Physics +17

Scanning electron microscope observation of dislocations in semiconductor and metal materials

N. Kuwano, M. Itakura, Yasuhiro Nagatomo et al. · Journal of Electron Microscopy · 2010 · 24 citations

Engineering, Materials Engineering, Materials Science +17

Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials

M. Itakura, N. Kuwano, K. Satô et al. · Journal of Electron Microscopy · 2010 · 24 citations

Engineering, Materials Engineering, Materials Science +15

Observation of Electrochemical Reaction and Biological Specimen by Novel Analytical Technique Combined with Room-Temperature Ionic Liquid and Scanning Electron Microscope

Tetsuya Tsuda, Eiko Mochizuki, Shoko Kishida et al. · Electrochemistry · 2012 · 21 citations · Full text

Natural Sciences, Chemistry, Materials Science +16