Weichang Xie

Fundamental aspects of resolution and precision in vertical scanning white-light interferometry

Peter Lehmann, Stanislav Tereschenko, Weichang Xie · Surface Topography Metrology and Properties · 2016 · 93 citations · Full text

High Resolution, Engineering, Swli Phase Evaluation +20

Lateral resolution and transfer characteristics of vertical scanning white-light interferometers

Weichang Xie, Peter Lehmann, Jan Niehues · Applied Optics · 2012 · 57 citations

White-light Interferometers, Engineering, Measurement +16

Signal modeling in low coherence interference microscopy on example of rectangular grating

Weichang Xie, Peter Lehmann, Jan Niehues et al. · Optics Express · 2016 · 39 citations · Full text

Transient Grating, Engineering, Microscopy +19

Coherence scanning and phase imaging optical interference microscopy at the lateral resolution limit

Peter Lehmann, Weichang Xie, Benedikt Allendorf et al. · Optics Express · 2018 · 34 citations · Full text

Holography, Engineering, Microscopy +32

Reduction of chromatic aberration influences in vertical scanning white-light interferometry

Peter Lehmann, Peter Kühnhold, Weichang Xie · Measurement Science and Technology · 2014 · 26 citations

Optical Materials, Engineering, Optic Design +24