J. Wittge

White beam synchrotron topography using a high resolution digital X-ray imaging detector

A.N. Danilewsky, Alexander Rack, J. Wittge et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2008 · 39 citations

Synchrotron Radiation Research, Health Sciences, Medical Imaging +6

Crack propagation and fracture in silicon wafers under thermal stress

A.N. Danilewsky, J. Wittge, Konstantin Kiefl et al. · Journal of Applied Crystallography · 2013 · 35 citations · Full text

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

A.N. Danilewsky, J. Wittge, A. Croell et al. · Journal of Crystal Growth · 2010 · 32 citations · Full text

Materials Science, X-ray Diffraction Imaging, Engineering +10

Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography

D.M. Allen, J. Wittge, A. Zlotos et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 20 citations

Materials Science, Micro-raman Spectroscopy, Silicon Wafers +9

Thermal slip sources at the extremity and bevel edge of silicon wafers

B. K. Tanner, J. Wittge, D.M. Allen et al. · Journal of Applied Crystallography · 2011 · 20 citations · Full text

Engineering, Bevel Edge, Dislocation Sources +24