7
Publications
344
Citations
7
H-Index
2008
Active since
Affiliations
Stefan Hoek is an author at Omron (Japan) specializing in engineering, instrumentation, and measurement.
Top concepts
EngineeringInstrumentationEducationMeasurementElectrical EngineeringElectromagnetic CompatibilityNoisePulse PowerSignal ProcessingCalibration
Publications per year
2008–2019
7
7
Rows per page
1–5 of 7