D. T. Fewer

Optical measurement of the ambipolar diffusion length in a ZnCdSe–ZnSe single quantum well

F. P. Logue, D. T. Fewer, S. J. Hewlett et al. · Journal of Applied Physics · 1997 · 22 citations

Optical Materials, Engineering, Image Luminescence +21

Direct‐view microscopy: experimental investigation of the dependence of the optical sectioning characteristics on pinhole‐array configuration

D. T. Fewer, S. J. Hewlett, Eithne M. McCabe et al. · Journal of Microscopy · 1997 · 22 citations

Optical Design, Holography, Direct‐view Microscopy +21

Direct‐view microscopy: optical sectioning strength for finite‐sized, multiple‐pinhole arrays

Eithne M. McCabe, D. T. Fewer, Adrian C. Ottewill et al. · Journal of Microscopy · 1996 · 19 citations

Direct‐view Microscopy, Fluorescence Microscopy, Engineering +15

Defect annealing in a II–VI laser diode structure under intense optical excitation

C. Jordan, D. T. Fewer, John F. Donegan et al. · Applied Physics Letters · 1998 · 13 citations · Full text

Intense Optical Excitation, Optical Materials, Point Defects +20