Statistics
Publications
2
Citations
110
H-Index
2
Active since
2009
Affiliations
Case Western Reserve University(Current)
William Clay is an author at Case Western Reserve University specializing in device reliability, cmos reliability, and engineering.
Publications per year
2009–2010
2
2
Process reliability based trojans through NBTI and HCI effects
Yuriy Shiyanovskii, Francis Wolff, Aravind Rajendran et al. · 2010 · 98 citations
Engineering, Computer Engineering, Electrical Engineering +14
Exploiting Semiconductor Properties for Hardware Trojans
Yuriy Shiyanovskii, Francis Wolff, C. Papachristou et al. · ArXiv.org · 2009 · 12 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
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