Yuriy Shiyanovskii

Process reliability based trojans through NBTI and HCI effects

Yuriy Shiyanovskii, Francis Wolff, Aravind Rajendran et al. · 2010 · 98 citations

Engineering, Computer Engineering, Electrical Engineering +14

SRAM Cell Design Protected from SEU Upsets

Yuriy Shiyanovskii, Francis Wolff, C. Papachristou · 2008 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +15

A low power memory cell design for SEU protection against radiation effects

Yuriy Shiyanovskii, Aravind Rajendran, C. Papachristou · 2012 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +17

Noise margin, critical charge and power-delay tradeoffs for SRAM design

Aravind Rajendran, Yuriy Shiyanovskii, Frank Wolff et al. · 2011 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17

Exploiting Semiconductor Properties for Hardware Trojans

Yuriy Shiyanovskii, Francis Wolff, C. Papachristou et al. · ArXiv.org · 2009 · 12 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17