D. Tsamakis

Accurate measurements of the silicon intrinsic carrier density from 78 to 340 K

D. Tsamakis · Journal of Applied Physics · 1993 · 147 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Hydrogen gas sensors based on PLD grown NiO thin film structures

M. Stamataki, D. Tsamakis, I. Fasaki et al. · physica status solidi (a) · 2008 · 89 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Non-destructive evaluation of magnetic metallic materials using Hall sensors

Konstantinos Kosmas, Ch. Sargentis, D. Tsamakis et al. · Journal of Materials Processing Technology · 2005 · 71 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Anomalous effects on the current-voltage characteristics of <i>p</i>-channel metal-oxide-semiconductor transistors in the temperature range 4.2–50 K

A. G. Nassiopoulos, D. Tsamakis, E. Rocofyllou · Journal of Applied Physics · 1990 · 66 citations

Engineering, Electrical Engineering, Microelectronics +16

Tungsten Oxide Thin Films Chemically Vapor Deposited at Low Pressure by  W  (  CO  ) 6 Pyrolysis

Dimitris Davazoglou, A. Moutsakis, V. Valamontes et al. · Journal of The Electrochemical Society · 1997 · 45 citations

Natural Sciences, Materials Engineering, Materials Science +17