Patrick Mertens is an author at RWTH Aachen University specializing in outlier detection, computer vision, and engineering.
Top concepts
EngineeringData ScienceDeep LearningImage AnalysisMachine VisionComputer VisionComputer ScienceMachine LearningAnomaly DetectionOutlier Detection
Publications per year
2021–2021
2
2
Rows per page
1–2 of 2