C. Ohlhoff

Optoelectronic on-chip characterization of ultrafast electric devices: Measurement techniques and applications

H.–M. Heiliger, Thomas Löffler, C. Ohlhoff et al. · IEEE Journal of Selected Topics in Quantum Electronics · 1996 · 60 citations

Engineering, Electrical Engineering, Materials Science +17

Optical second-harmonic generation as a probe of electric-field-induced perturbation of centrosymmetric media

G. Lüpke, Sebastian Lehmann, G. Marowsky et al. · Optics Letters · 1995 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Static and high-frequency electric fields in silicon MOS and MS structures probed by optical second-harmonic generation

C. Ohlhoff, G. Lüpke, C. Meyer et al. · Physical review. B, Condensed matter · 1997 · 38 citations

Engineering, Electrical Engineering, Materials Science +17

Optical second-harmonic probe for silicon millimeter-wave circuits

C. Ohlhoff, C. Meyer, G. Lüpke et al. · Applied Physics Letters · 1996 · 28 citations

Engineering, Electrical Engineering, Antennas +14