Binding and mobility of isolated indium atoms on Si(111)7×7

Georg Krausch, Thomas Detzel, R. Fink, +3

Physical Review Letters

EngineeringChemistrySilicon On InsulatorIsolated Indium AtomsRegular Adsorption Sites +16

Monolayer-resolved detection of magnetic hyperfine fields at Cu/Ni(111) interfaces

J. Voigt, Xianghong Ding, R. Fink, +4

Physical Review Letters

Magnetic PropertiesEngineeringMagnetic ResonanceMagnetic MaterialsMagnetoresistance +16

Step-correlated diffusion of in atoms on Ag(100) and Ag(111) surfaces

R. Fink, R. Wesche, T. Klas, +5

Surface Science

Surface CharacterizationStep-correlated DiffusionEngineeringPhysicsSurface Chemistry +9

Microscopic observation of atomic disorder near the roughening transition at vicinal copper surfaces

R. Fink, Georg Krausch, R. Platzer, +2

Physical Review Letters

EngineeringElectronic StructureQuantum MaterialsMicroscopic ObservationVicinal Copper Surfaces +18

Hyperfine-interaction studies of surfaces

G. Schätz, Xianghong Ding, R. Fink, +5

Hyperfine Interactions

EngineeringHyperfine-interaction StudiesPhysicsGeometryFunctional Surface +4

Indium adsorption sites at Pd(100) surfaces studied by PAC spectroscopy

R. Fink, B.‐U. Runge, Karin Jacobs, +4

Journal of Physics Condensed Matter

Terrace OrientationEngineeringVicinal Pd SurfacesIndium Adsorption SitesProbe Atoms +17

Compound formation in Ni/In thin film systems

R. Platzer, U. Wöhrmann, Xianghong Ding, +5

Hyperfine Interactions

Materials ScienceEngineeringSurface ScienceApplied PhysicsThin Films +3

Indium adsorption on silicon surfaces: a PAC study

Georg Krausch, R. Fink, Karin Jacobs, +4

Surface Science

EngineeringSurface ScienceApplied PhysicsChemisorptionAdsorption +2

Microscopic Observation of a Superstructure Phase Transition: In/Si(100)

Georg Krausch, Karin Jacobs, R. Fink, +4

Europhysics Letters (EPL)

Superstructure Phase TransitionEngineeringPhysicsCrystalline DefectsPac Method +11

Interface compound formation and dependence on In-layer thickness in Ni/In thin-film systems

R. Platzer, U. Wöhrmann, Xianghong Ding, +4

Applied Physics Letters

EngineeringThin Film Process TechnologyNi/in Thin-film SystemsInterface Compound FormationEpitaxial Growth +14