Concepedia

Young-Sik Ghim

YG

25

Publications

673

Citations

18

H-Index

2006

Active since

Affiliations

Korea Research Institute of Standards and Science(Current)

Korea University of Science and Technology

University of North Carolina at Charlotte

Chosun University

Korea Advanced Institute of Science and Technology

Young-Sik Ghim is an author at Korea Research Institute of Standards and Science specializing in engineering, instrumentation, and microscopy.

Top concepts

EngineeringInstrumentationMicroscopyInterferometryOptical PropertiesCalibrationPhotonic MetrologyApplied PhysicsMeasurementGeometry Modeling

Publications per year

2006–2023

25

Publications

25

Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Young-Sik Ghim, Seung‐Woo Kim · Optics Express · 2006 · 92 citations · Full text

Engineering, Microscopy, Optical Testing +16

Fast, precise, tomographic measurements of thin films

Young-Sik Ghim, Seung‐Woo Kim · Applied Physics Letters · 2007 · 49 citations

Nondestructive Measurement Method, Electrical Engineering, Engineering +12

Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure

Young-Sik Ghim, Seung‐Woo Kim · Applied Optics · 2009 · 46 citations

Engineering, Microscopy, Optical Testing +16

Complete fringe order determination in scanning white-light interferometry using a Fourier-based technique

Young-Sik Ghim, Angela Davies · Applied Optics · 2012 · 43 citations

Holography, Engineering, Microscopy +20

3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometry

Young-Sik Ghim, Hyug-Gyo Rhee, Angela Davies et al. · Optics Express · 2014 · 42 citations · Full text

Engineering, Microscopy, Optic Design +17

Rows per page

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