Pete R. Jemian

Glassy Carbon as an Absolute Intensity Calibration Standard for Small-Angle Scattering

Fan Zhang, Ján Ilavský, Gabrielle G. Long et al. · Metallurgical and Materials Transactions A · 2009 · 427 citations · Full text

Natural Sciences, Materials Science, Physics +15

Ultra-small-angle X-ray scattering at the Advanced Photon Source

Ján Ilavský, Pete R. Jemian, Andrew J. Allen et al. · Journal of Applied Crystallography · 2009 · 289 citations

Natural Sciences, Nuclear Engineering, Optics +14

The NeXus data format

Mark Könnecke, Frederick Akeroyd, H. J. Bernstein et al. · Journal of Applied Crystallography · 2015 · 189 citations · Full text

Computing, Computer Science, Data Engineering +12

Development of combined microstructure and structure characterization facility for <i>in situ</i> and <i>operando</i> studies at the Advanced Photon Source

Ján Ilavský, Fan Zhang, Ross N. Andrews et al. · Journal of Applied Crystallography · 2018 · 180 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Determination of Phonon Dispersions from X-Ray Transmission Scattering: The Example of Silicon

Martin V. Holt, Zhanjun Wu, Hawoong Hong et al. · Physical Review Letters · 1999 · 94 citations

Natural Sciences, Materials Science, Physics +17