Y. Kohama

Determination of the critical layer thickness of Si1−<i>x</i>Ge<i>x</i>/Si heterostructures by direct observation of misfit dislocations

Y. Kohama, Yukio Fukuda · Applied Physics Letters · 1988 · 103 citations

Materials Science, Semiconductors, Critical Layer Thickness +14

Room temperature pulsed operation of 1.5 mu m GaInAsP/InP vertical-cavity surface-emitting laser

Takashi Tadokoro, Hiroshi Okamoto, Y. Kohama et al. · IEEE Photonics Technology Letters · 1992 · 49 citations

Short Wavelength Optic, Optical Materials, Engineering +20

High quality heteroepitaxial Ge growth on (100) Si by MBE

Yukio Fukuda, Y. Kohama · Journal of Crystal Growth · 1987 · 42 citations

Materials Science, Semiconductor Technology, Engineering +5

Monolithically integrated photonic switching device using an MSM PD, MESFETs, and a VCSEL

Shinji Matsuo, Tadaki Nakahara, Y. Kohama et al. · IEEE Photonics Technology Letters · 1995 · 40 citations

Optical Materials, Engineering, Device Integration +20

Carbon doping and etching effects of CBr4 during metalorganic chemical vapor deposition of GaAs and AlAs

Kouta Tateno, Y. Kohama, Chikara Amano · Journal of Crystal Growth · 1997 · 38 citations

Materials Engineering, Electrical Engineering, Engineering +9