Statistics
Publications
1
Citations
402
H-Index
1
Active since
2002
Affiliations
Siemens (Germany)(Current)
N. Marz is an author at Siemens (Germany) specializing in gate oxide degradation, device scaling, and microelectronics.
Publications per year
2002–2002
1
1
A new generation of high voltage MOSFETs breaks the limit line of silicon
Gerald Deboy, N. Marz, Josef Štengl et al. · 2002 · 402 citations
Engineering, Electrical Engineering, Electronic Materials +13
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