A.J.G. Schellingerhout

Critical thickness for pseudomorphic growth of Si/Ge alloys and superlattices

R.H.M. van de Leur, A.J.G. Schellingerhout, F. Tuinstra et al. · Journal of Applied Physics · 1988 · 85 citations

Natural Sciences, Materials Science, Physics +16

Determination of the energy gap in a thin YBa2Cu3O7−x film by Andreev reflection and by tunneling

H. Hoevers, P. J. M. van Bentum, L. E. C. van de Leemput et al. · Physica C Superconductivity · 1988 · 59 citations

Natural Sciences, Materials Science, Physics +16

Rate control for electron gun evaporation

A.J.G. Schellingerhout, M. A. Janocko, T. M. Klapwijk et al. · Review of Scientific Instruments · 1989 · 11 citations

Natural Sciences, Electrical Engineering, Physics +10

Mass-spectrometer-controlled fabrication of Si/Ge superlattices

R.H.M. van de Leur, A.J.G. Schellingerhout, J. E. Mooij et al. · Applied Physics Letters · 1988 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +15