Formation of Al Nanostructures on Alq3: An in Situ Grazing Incidence Small Angle X-ray Scattering Study during Radio Frequency Sputter Deposition

Shun Yu, Gonzalo Santoro, Kuhu Sarkar, +12

The Journal of Physical Chemistry Letters

Aluminium NitrideX-ray SpectroscopyEngineeringOrganic ElectronicsSitu Gisaxs Yields +15

Ultrafast photofragmentation dynamics of molecular iodine driven with timed XUV and near-infrared light pulses

Maria Krikunova, Theophilos Maltezopoulos, Philipp Wessels, +4

The Journal of Chemical Physics

Direct observation of isolated Damon-Eshbach and backward volume spin-wave packets in ferromagnetic microstripes

Philipp Wessels, Andreas Vogel, Jan-Niklas Tödt, +3

Scientific Reports

Absolute strong-field ionization probabilities of ultracold rubidium atoms

Philipp Wessels, Bernhard Ruff, Tobias Kroker, +5

Communications Physics

Time-resolved soft X-ray microscopy of magnetic nanostructures at the P04 beamline at PETRA III

Philipp Wessels, Johannes Ewald, Marek Wieland, +11

Journal of Physics Conference Series

EngineeringMicroscopyMagnetic ResonanceMagnetic MaterialsSynchrotron Radiation Source +15

Strong-field ionization of molecular iodine traced with XUV pulses from a free-electron laser

Maria Krikunova, Theophilos Maltezopoulos, Philipp Wessels, +6

Physical Review A

EngineeringAsymmetric Charge DistributionLaser-plasma InteractionMolecular IodineKinetic Energy Release +19

Ultrafast electron cooling in an expanding ultracold plasma

Tobias Kroker, Mario Großmann, K. Sengstock, +3

Nature Communications

Following the Island Growth in Real Time: Ag Nanocluster Layer on Alq3 Thin Film

Shun Yu, Gonzalo Santoro, Yuan Yao, +9

The Journal of Physical Chemistry C

EngineeringNanoclusterOrganic ElectronicsSurface NanotechnologyMetallic Nanomaterials +18

Time-resolved imaging of domain pattern destruction and recovery via nonequilibrium magnetization states

Philipp Wessels, Johannes Ewald, Marek Wieland, +6

Physical Review B

EngineeringMicroscopyDomain Formation ProcessMagnetic ResonanceMagnetic Resonance Imaging +22

Stresses in sputtered Ti-Si multilayers and polycrystalline silicide films

Philipp Wessels, J. F. Jongste, G. C. A. M. Janssen, +3

Journal of Applied Physics

Materials EngineeringMaterials ScienceSilicide FilmTitanium Silicon MultilayersEngineering +10