R. F. Boehme

Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure

A. Erbil, G. S. Cargill, R. Frahm et al. · Physical review. B, Condensed matter · 1988 · 246 citations

Materials Science, Total-electron-yield Technique, X-ray Spectroscopy +15

Annealing of Heavily Arsenic-Doped Silicon: Electrical Deactivation and a New Defect Complex

K. C. Pandey, A. Erbil, G. S. Cargill et al. · Physical Review Letters · 1988 · 161 citations

Engineering, New Defect Complex, Heavily Arsenic-doped Silicon +21

Synthesis of the defect perovskite series LaCu03–δ with copper valence varying from 2+ to 3+

Joseph F. Bringley, B. A. Scott, S. J. La Placa et al. · Nature · 1990 · 89 citations

Materials Science, Inorganic Chemistry, Materials Engineering +8

Wave Functions Derived by Quantum Modeling of the Electron Density from Coherent X-Ray Diffraction: Beryllium Metal

L. J. Massa, Martin J. Goldberg, C. Frishberg et al. · Physical Review Letters · 1985 · 89 citations

X-ray Crystallography, Engineering, Electron Diffraction +23

Lattice distortions for arsenic in single-crystal silicon

A. Erbil, W. Weber, G. S. Cargill et al. · Physical review. B, Condensed matter · 1986 · 80 citations

Materials Science, X-ray Spectroscopy, Engineering +13