Jim Haden

Mitigation of thermal lensing effect as a brightness limitation of high-power broad area diode lasers

Paul O. Leisher, Shiguo Zhang, Sandrio Elim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 50 citations

Engineering, Electrical Engineering, Optics +16

Reliability and performance of 808-nm single emitter multi-mode laser diodes

J. Wang, L. Bao, Mark DeVito et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2010 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

High reliability of high power and high brightness diode lasers

Manoj Kanskar, L. Bao, John G. Bai et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

Performance limitation and mitigation of longitudinal spatial hole burning in high-power diode lasers

Zhigang Chen, Ling Bao, Mike Grimshaw et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2012 · 15 citations

Engineering, Electrical Engineering, Optoelectronics +16

Reliability of high power/brightness diode lasers emitting from 790 to 980 nm

L. Bao, John G. Bai, Kirk Price et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 13 citations

Engineering, Electrical Engineering, Materials Science +16