Eider Gorostegui-Colinas

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

A.N. Danilewsky, J. Wittge, A. Croell et al. · Journal of Crystal Growth · 2010 · 32 citations · Full text

Materials Science, X-ray Diffraction Imaging, Engineering +10

Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topography

D.M. Allen, J. Wittge, A. Zlotos et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 20 citations

Materials Science, Micro-raman Spectroscopy, Silicon Wafers +9

Dislocation sources and slip band nucleation from indents on silicon wafers

J. Wittge, A.N. Danilewsky, D.M. Allen et al. · Journal of Applied Crystallography · 2010 · 16 citations · Full text

Engineering, Mechanical Engineering, Dislocation Sources +18

Calculating probability of detection of short surface cracks using inductive thermography

Beate Oswald-Tranta, Alexander Hackl, Pablo Lopez de Uralde Olavera et al. · Quantitative InfraRed Thermography Journal · 2022 · 15 citations · Full text

Artificial Defects, Engineering, Mechanical Engineering +19

Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

A.N. Danilewsky, J. Wittge, A. Cröll et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 14 citations

Materials Science, Engineering, Dislocation Interaction +11