Ivo Konvalina

Comparison of calculated, simulated and measured signal amplification in a variable pressure SEM

Vilém Neděla, Ivo Konvalina, Bohumila Lencová et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2010 · 35 citations

Engineering, Measurement, Calibration +5

Very low energy scanning electron microscopy

L. Frank, Miloš Hovorka, Ivo Konvalina et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2011 · 30 citations

Engineering, Electron Microscopy, Microscopy +4

Collection of secondary electrons in scanning electron microscopes

Ilona Müllerová, Ivo Konvalina · Journal of Microscopy · 2009 · 21 citations

The trajectories of secondary electrons in the scanning electron microscope

Ivo Konvalina, Ilona Müllerová · Scanning · 2006 · 18 citations · Full text

Engineering, Electron Microscopy, Physics +13

In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

Ivo Konvalina, Filip Mika, Stanislav Krátký et al. · Materials · 2019 · 18 citations · Full text

Engineering, Microscopy, Secondary Electrons +16