Seong‐Hyun Hwang

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Sungju Choi, Jingyu Park, Seong‐Hyun Hwang et al. · Advanced Electronic Materials · 2022 · 46 citations

Engineering, Electrical Engineering, Materials Science +17

Effects of Al2O3 surface passivation on the radiation hardness of IGTO thin films for thin-film transistor applications

Seong‐Hyun Hwang, Kie Yatsu, Dongho Lee et al. · Applied Surface Science · 2021 · 38 citations

Engineering, Materials Engineering, Materials Science +17

Effects of proton beam irradiation on the physical and chemical properties of IGTO thin films with different thicknesses for thin-film transistor applications

Mingyu Shin, Seong‐Hyun Hwang, Hyun-Seok Cha et al. · Surfaces and Interfaces · 2021 · 33 citations

Natural Sciences, Materials Engineering, Materials Science +16

Effects of Active Layer Thickness on the Electrical Characteristics and Stability of High-Mobility Amorphous Indium–Gallium–Tin Oxide Thin-Film Transistors

Dae‐Hwan Kim, Hyun-Seok Cha, Hwan-Seok Jeong et al. · Electronics · 2021 · 27 citations · Full text

Engineering, Electrical Engineering, Materials Science +16

Electrical Performance and Stability Improvement of p-Channel SnO Thin-Film Transistors Using Atomic-Layer-Deposited Al₂O₃ Capping Layer

Kang-Hwan Bae, Min Gyu Shin, Seong‐Hyun Hwang et al. · IEEE Access · 2020 · 21 citations · Full text

Engineering, Materials Engineering, Materials Science +14