V.P. Nelson

Fault-tolerant computing: fundamental concepts

V.P. Nelson · Computer · 1990 · 358 citations

Engineering, Verification, Computer Architecture +18

Extending integrated-circuit yield-models to estimate early-life reliability

T.S. Barnett, A.D. Singh, V.P. Nelson · IEEE Transactions on Reliability · 2003 · 35 citations

Engineering, Reliability Engineering, Modeling And Simulation +16

System-level Built-In Self-Test of global routing resources in Virtex-4 FPGAs

Yao Jia, Bobby Dixon, Charles E. Stroud et al. · 2009 · 21 citations

Hardware Security, Global Routing Resources, Engineering +14

Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems

George J. Starr, Jie Qin, Bradley F. Dutton et al. · 2009 · 20 citations

Engineering, Measurement, Analog Design +19

Burn-in failures and local region yield: an integrated field-reliability model

T.S. Barnett, A.D. Singh, V.P. Nelson · 2002 · 18 citations

Engineering, Reliability Engineering, Failure Analysis +16