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Active since
2010
De-Tao Huang is an author specializing in device reliability, heavy ion radiation, and radiation damage in materials.
Publications per year
2010–2010
Impact of the displacement damage in channel and source/drain regions on the DC characteristics degradation in deep-submicron MOSFETs after heavy ion irradiation
Shoubin Xue, Ru Huang, De-Tao Huang et al. · Chinese Physics B · 2010 · 14 citations
Engineering, Electrical Engineering, Radiation Physics +15
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