Statistics
Publications
2
Citations
44
H-Index
2
Active since
1973
Affiliations
Klinikum Sindelfingen-Böblingen(Current)
W. Jaerisch is an author at Klinikum Sindelfingen-Böblingen specializing in optical metrology, surface metrology, and wafer flatness measurement.
Publications per year
1973–1978
2
2
Optical Contour Mapping of Surfaces
W. Jaerisch, G. Makosch · Applied Optics · 1973 · 33 citations
Engineering, Physics, Machine Vision +15
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