G. Fedi

Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits

G. Fedi, S. Manetti, Maria Cristina Piccirilli et al. · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 1999 · 87 citations · Full text

Fault Diagnosis, Electrical Engineering, Reliability Engineering +13

On the application of symbolic techniques to the multiple fault location in low testability analog circuits

G. Fedi, R. Giomi, Antonio Luchetta et al. · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 1998 · 55 citations

Fault Diagnosis, Engineering, Analog Design +16

Finding ambiguity groups in low testability analog circuits

Janusz A. Starzyk, Jun Pang, S. Manetti et al. · IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications · 2000 · 54 citations

Fault Diagnosis, Engineering, Analog Design +18

Profiled corrugated circular horns analysis and synthesis via an artificial neural network

G. Fedi, S. Manetti, Giuseppe Pelosi et al. · IEEE Transactions on Antennas and Propagation · 2001 · 34 citations

Engineering, Circular Horns Analysis, Antenna +8

A new symbolic method for analog circuit testability evaluation

G. Fedi, Antonio Luchetta, S. Manetti et al. · IEEE Transactions on Instrumentation and Measurement · 1998 · 28 citations

New Symbolic Method, Engineering, Verification +19