C. Sénémaud

Band structure of carbonated amorphous silicon studied by optical, photoelectron, and x-ray spectroscopy

I. Solomon, Martin Schmidt, C. Sénémaud et al. · Physical review. B, Condensed matter · 1988 · 151 citations

Optical Materials, X-ray Spectroscopy, Engineering +20

Nomenclature, symbols, units and their usage in spectrochemical analysis - VIII. Nomenclature system for X-ray spectroscopy (Recommendations 1991)

R. Jenkins, Rolf Manne, Richard M. Robin et al. · Pure and Applied Chemistry · 1991 · 87 citations · Full text

X-ray Spectroscopy, Engineering, Natural Sciences +7

Structural determination of sintered Si3N4/SiC nanocomposite using the XPS differential charge effect

F. Ténégal, A. Gheorghiu de la Rocque, G. Dufour et al. · Journal of Electron Spectroscopy and Related Phenomena · 2000 · 53 citations

Materials Engineering, Materials Science, Engineering +7

Atomic configurations and local order in laser-synthesized Si, Si-N, Si-C, and Si-C-N nanometric powders, as studied by x-ray-induced photoelectron spectroscopy and extended x-ray-absorption fine-structure analysis

A. Gheorghiu, C. Sénémaud, H. Roulet et al. · Journal of Applied Physics · 1992 · 49 citations

X-ray Spectroscopy, Engineering, Si-c-n Nanometric Powders +18

IUPAC—nomenclature system for x‐ray spectroscopy

R. Jenkins, Rolf Manne, Richard M. Robin et al. · X-Ray Spectrometry · 1991 · 42 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +13