Constant A. J. Putman

Tapping mode atomic force microscopy in liquid

Constant A. J. Putman, Kees O. van der Werf, B.G. de Grooth et al. · Applied Physics Letters · 1994 · 534 citations · Full text

Engineering, Microscopy, Mechanical Engineering +16

A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

Constant A. J. Putman, B.G. de Grooth, N.F. van Hulst et al. · Journal of Applied Physics · 1992 · 246 citations · Full text

Atomic Force Microscopy, Optical Materials, Engineering +20

Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy

Constant A. J. Putman, Kees O. van der Werf, B.G. de Grooth et al. · Biophysical Journal · 1994 · 215 citations · Full text

Engineering, Microscopy, Cell Mechanics +17

Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

Kees O. van der Werf, Constant A. J. Putman, B.G. de Grooth et al. · Applied Physics Letters · 1994 · 190 citations · Full text

Engineering, Adhesion Force, Microscopy +18

<title>New imaging mode in atomic-force microscopy based on the error signal</title>

Constant A. J. Putman, Kees O. van der Werf, B.G. de Grooth et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1992 · 86 citations

Engineering, Microscopy, Error Signal +18