Statistics
Publications
24
Citations
2K
H-Index
19
Active since
1983
Constant A. J. Putman is an author at University of Twente specializing in atomic force microscopy, natural sciences, and atomic force microscopy analysis.
Publications per year
1983–1996
24
24
Tapping mode atomic force microscopy in liquid
Constant A. J. Putman, Kees O. van der Werf, B.G. de Grooth et al. · Applied Physics Letters · 1994 · 536 citations · Full text
<title>New imaging mode in atomic-force microscopy based on the error signal</title>
Constant A. J. Putman, Kees O. van der Werf, B.G. de Grooth et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1992 · 87 citations
Natural Sciences, Bioengineering, Biomedical Engineering +15
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