Concepedia

James J. Kulikowski

JJ

Statistics

Publications

5

Citations

233

H-Index

5

Active since

1985

Affiliations

AT&T (United States)(Current)

James J. Kulikowski is an author at AT&T (United States) specializing in engineering, design for testability, and computer engineering.

Publications per year

1985–2005

5

Publications

5

SMART And FAST: Test Generation for VLSI Scan-Design Circuits

M. Abramovici, James J. Kulikowski, P.R. Menon et al. · IEEE Design & Test of Computers · 1986 · 99 citations

Engineering, Computer Engineering, Electrical Engineering +11

The Best Flip-Flops to Scan

M. Abramovici, James J. Kulikowski, Ranjan Roy · 2005 · 91 citations

Engineering, Computer Engineering, Electrical Engineering +14

Test Generation In Lamp2: Concepts and Algorithms.

M. Abramovici, James J. Kulikowski, P.R. Menon et al. · International Test Conference · 1985 · 20 citations

Engineering, Computer Engineering, Computer Science +7

System Simulation with MIDAS

J Bierbauer, Jonathan A. Eiseman, Faiq A. Fazal et al. · AT&T Technical Journal · 1991 · 12 citations

Architecture, Design, Systems Engineering +14

Test Generation In Lamp2: System Overview.

M. Abramovici, James J. Kulikowski, P.R. Menon et al. · International Test Conference · 1985 · 11 citations

Engineering, Computer Engineering, Computer Systems +11

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