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Publications
1
Citations
14
H-Index
Active since
2002
J.K. McDaniel is an author specializing in reliability engineering, applied physics, and electronic packaging.
Top concepts
EngineeringReliabilityApplied PhysicsMicroelectronicsElectronic PackagingElectrical InsulationElectrical EngineeringReliability Engineering
Publications per year
2002–2002
Relationship between yield and reliability impact of plasma damage to gate oxide
P.W. Mason, Damon K. DeBusk, J.K. McDaniel et al. · 2002 · 14 citations
Engineering, Antenna Testers, Reliability Engineering +16
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