Concepedia
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Publications
1
Citations
11
H-Index
Active since
2014
Ken Decker is an author specializing in voltage, semiconductor reliability, and silicon nitride.
Publications per year
2014–2014
Silicon Nitride MIM Capacitor Reliability for Multiple Dielectric Thicknesses
J.M. Beall, Ken Decker, K. Salzman · 2014 · 11 citations
Engineering, Electrical Engineering, Materials Science +13
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