S Strehlke - Concepedia

Author

S Strehlke

Centre National de la Recherche Scientifique

Also Known As

S Strehlke, S. Strehlke

Publications

333

Citations

H-Index

Concepts

All Affiliations

Centre National de la Recherche Scientifique Laboratoire de physique des Solides Institute for Technical Physics and Materials Science

About

S Strehlke is an author at Centre National de la Recherche Scientifique specializing in engineering, applied physics, and photovoltaics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	323
2	Applied Physics	7	7	323
3	Electrical Engineering	4	4	217
4	Chemical Engineering	1	1	18
5	Chemistry	1	1	18

S Strehlke

Publications

323

Citations

H-Index

Page 1

	Year	Citations
Multicrystalline silicon solar cells with porous silicon emitter R. Bilyalov, R. Lüdemann, W. Wettling, Solar Energy Materials and Solar Cells Electrical EngineeringEngineeringApplied PhysicsSilicon On InsulatorSolar Cells	2000	96
Design of porous silicon antireflection coatings for silicon solar cells S Strehlke, Stéphane Bastide, J. Guillet, Materials Science and Engineering B Materials ScienceEngineeringSolar PowerSurface ScienceApplied Physics	2000	77
Optimization of porous silicon reflectance for silicon photovoltaic cells S Strehlke, Stéphane Bastide, Claude Lévy‐Clément Solar Energy Materials and Solar Cells Electrical EngineeringEngineeringPorous Silicon ReflectanceSolar PowerApplied Physics	1999	51
The porous silicon emitter concept applied to multicrystalline silicon solar cells S Strehlke, D. Sarti, A. Krotkus, Thin Solid Films Materials ScienceElectrical EngineeringEngineeringNanoporous MaterialNanoelectronics	1997	47
Formation and characterization of porous silicon layers for application in multicrystalline silicon solar cells Stéphane Bastide, Ana Albu‐Yaron, S Strehlke, Solar Energy Materials and Solar Cells Materials ScienceElectrical EngineeringEngineeringNanoporous MaterialPorous Membrane	1999	23
Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy M. Fried, O. Polgár, T. Lohner, Journal of Luminescence Surface CharacterizationChemical EngineeringEngineeringSurface AnalysisSurface Science	1998	18
Characterization of Thin Porous Silicon Films Formed on n[sup +]/p Silicon Junctions by Spectroscopic Ellipsometry S Strehlke, Stéphane Bastide, O. Polgár, Journal of The Electrochemical Society EngineeringNanoporous MaterialOptoelectronic DevicesIntegrated CircuitsThin Porous Silicon	2000	11

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