Ramesh M. Krishna

Characterization of Semi-Insulating 4H Silicon Carbide for Radiation Detectors

Krishna C. Mandal, Ramesh M. Krishna, Peter G. Muzykov et al. · IEEE Transactions on Nuclear Science · 2011 · 56 citations

Engineering, Materials Engineering, Materials Science +17

Fabrication and Characterization of ${\rm Cd}_{0.9}{\rm Zn}_{0.1}{\rm Te}$ Schottky Diodes for High Resolution Nuclear Radiation Detectors

Krishna C. Mandal, Ramesh M. Krishna, Peter G. Muzykov et al. · IEEE Transactions on Nuclear Science · 2012 · 41 citations

Engineering, Materials Engineering, Materials Science +17

Thermally stimulated current and high temperature resistivity measurements of 4H semi-insulating silicon carbide

Krishna C. Mandal, Peter G. Muzykov, Ramesh M. Krishna et al. · Solid State Communications · 2011 · 37 citations

Natural Sciences, Electrical Engineering, Materials Science +14

Characterization of deep levels in n-type and semi-insulating 4H-SiC epitaxial layers by thermally stimulated current spectroscopy

Peter G. Muzykov, Ramesh M. Krishna, Krishna C. Mandal · Journal of Applied Physics · 2012 · 34 citations

Natural Sciences, Materials Science, Physics +17

Characterization of 4H-SiC Epitaxial Layers and High-Resistivity Bulk Crystals for Radiation Detectors

Krishna C. Mandal, Peter G. Muzykov, Ramesh M. Krishna et al. · IEEE Transactions on Nuclear Science · 2012 · 31 citations

Engineering, Materials Engineering, Materials Science +17