Statistics
Publications
11
Citations
193
H-Index
10
Active since
2004
Affiliations
Vincenzo Tancorre is an author at STMicroelectronics (Italy) specializing in design for testability, engineering, and computer engineering.
Publications per year
2004–2023
11
11
Exploiting programmable bist for the diagnosis of embedded memory cores
D. Appello, Paolo Bernardi, A. Fudoli et al. · 2004 · 41 citations
Engineering, Computer Engineering, Electrical Engineering +15
Understanding yield losses in logic circuits
D. Appello, A. Fudoli, K. Giarda et al. · IEEE Design & Test of Computers · 2004 · 26 citations
Engineering, Computer Engineering, Electrical Engineering +17
On the Automation of the Test Flow of Complex SoCs
D. Appello, Vincenzo Tancorre, Paolo Bernardi et al. · 2006 · 20 citations
Embedded Memory Diagnosis: An Industrial Workflow
D. Appello, Vincenzo Tancorre, Paolo Bernardi et al. · 2006 · 19 citations
Yield analysis of logic circuits
D. Appello, A. Fudoli, K. Giarda et al. · 2004 · 16 citations
Engineering, Computer Engineering, Electrical Engineering +17
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