Statistics
Publications
1
Citations
50
H-Index
1
Active since
2002
Affiliations
Texas Instruments (United States)(Current)
M. St. John is an author at Texas Instruments (United States) specializing in design for testability, defects in electronic materials, and reliability degradation.
Publications per year
2002–2002
1
1
Delta Iddq for testing reliability
T.J. Powell, Jarrell Pair, M. St. John et al. · 2002 · 50 citations
Engineering, Electrical Engineering, Fault-tolerant Computing +10
1–1 of 1