A. A. Lomov

Characterization of process-induced defects in silicon with triple-crystal diffractometry

A. A. Lomov, P. Zaumseil, U. J. Winter · Acta Crystallographica Section A Foundations of Crystallography · 1985 · 70 citations

X-ray Spectroscopy, Engineering, Silicon Crystal +16

Limits of single crystal diamond surface mechanical polishing

S. N. Polyakov, A. A. Lomov, S. Yu. Troschiev et al. · Diamond and Related Materials · 2018 · 51 citations

Materials Engineering, Materials Science, Diamond-like Carbon +6

Mössbauer, magnetization and X-ray diffraction characterization methods for iron oxide nanoparticles

M. A. Polikarpov, I. Mischenko, A. A. Lomov et al. · Journal of Magnetism and Magnetic Materials · 2014 · 49 citations

Materials Science, Magnetism, Ferromagnetism +10

Grazing incidence diffraction X-ray topography

A. A. Lomov · physica status solidi (a) · 1989 · 31 citations

X-ray Spectroscopy, Engineering, Structural Geology +7

Diffraction scattering at angles far from the Bragg angle and the structure of thin subsurface layers

A. M. Afanas’ev, P. A. Aleksandrov, A. A. Lomov et al. · Acta Crystallographica Section A Foundations of Crystallography · 1984 · 28 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +24