Statistics
Publications
1
Citations
17
H-Index
1
Active since
2004
Affiliations
Frontier Scientific (United States)(Current)
V. Tirard is an author at Frontier Scientific (United States) specializing in microelectronics, gate oxide scaling, and lattice planes.
Publications per year
2004–2004
1
1
Nickel vs. cobalt silicide integration for sub-50nm CMOS
B. Froment, Markus Müller, H. Brut et al. · 2004 · 17 citations
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