4
Publications
77
Citations
4
H-Index
1988
Active since
Kunkul Ryoo is an author at Integrated Device Technology (United States) specializing in engineering, microelectronics, and defect tolerance.
Top concepts
EngineeringApplied PhysicsDefect ToleranceMicroelectronicsCrystalline DefectsElectrical EngineeringHealthPhysicsMedicineDna Damage
Publications per year
1988–2005
4
4
Rows per page
1–4 of 4